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Afm atomic force microscopy lateral Illustration and Icon
Afm atomic force microscopy lateral
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A lateral schematic of an AFM (atomic force microscopy) setup shows a sharp pyramidal probe mounted on a flexible microcantilever positioned above a flat sample surface. Within the instrument hierarchy, the probe tip attaches to the cantilever, which forms part of the scanning head. In surface science and nanometrology, this device measures nanoscale topography by monitoring cantilever deflection arising from tip–sample forces.
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